Test Pattern Development for Measuring Full Tranceiver Performance

Modern telecommunication equipment relies heavily on digital processing with the trend of digitizing as early as possible in the processing chain. This implies that the RF characteristics of the data converters are increasingly central to the perfor- mances of the equipment as a whole. Non-idealities affecting the transmission chains (in band flatness, linearity, spurious free dynamic range, noise floor..) that used to be directly measured with RF measuring instruments are now impossible to measure on the fully integrated system. The goal of this thesis is to design and simulate the test patterns that can be used to measure each characteristic. Finally measurement on legacy products from Antwerp Space will be performed. Note that a set of patterns for in-band flatness are already used by Antwerp Space and can be taken as an introductory example.

2019

Promoters

Yves Rolain
Antwerp Space NV
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